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Error Rate Tester Product List and Ranking from 5 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

Error Rate Tester Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  2. Yonata Electronics Tokyo//Testing, Analysis and Measurement
  3. セブンシックス Tokyo//Optical Instruments
  4. 4 アンリツ Kanagawa//Testing, Analysis and Measurement
  5. 5 ファストリンクテック Kanagawa//Consumer Electronics
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Error Rate Tester Product ranking

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. PBT3058 1.6T Bit Error Rate Tester Semi Next 本社、三重事業所
  2. 1.6T Bit Error Rate Tester 'B3224' Yonata Electronics
  3. Bit Error Rate Tester (BERT) "BA-4000" セブンシックス
  4. 4 BA-4000 Bit Analyzer ファストリンクテック
  5. 4 Bit Error Rate Tester "BA-4000" セブンシックス

Error Rate Tester Product List

1～6 item / All 6 items

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BA-4000 Bit Analyzer

BA-4000 Bit Analyzer

Four types are lined up! Baud rate, number of channels, and modulation methods are upgradeable.

We would like to introduce the 'BA-4000 Bit Analyzer' that we handle. The baud rate ranges from 28G to 56G, with options for 4 channels or 8 channels, both of which can be upgraded. The modulation methods available are NRZ/PAM, with NRZ being upgradeable to PAM4. As an option, we also offer FEC simulators and FEC generators. 【Product Lineup】 ■ 4×28GBd BERT ■ 8×28GBd BERT ■ 4×56GBd PAM4 BERT ■ 8×56GBd PAM4 BERT *You can download the English version of the catalog. For more details, please refer to the PDF materials or feel free to contact us.

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Bit Error Rate Tester "BA-4000"

Bit Error Rate Tester "BA-4000"

Full support for testing transmission standards of 800G/400G/200G/100G!

The "BA-4000" is an electrical BER tester that supports NRZ and PAM4 coding, equipped with advanced FEC tools, and has testing capabilities up to 800G. It is well-suited for testing and evaluating devices that use high-speed transmission standards such as PAM4 modulation methods for 800GbE/400GbE (optical transceivers, OSA, FPGA, etc.). The user interface displays the test results for each channel simply and in real-time. 【Features】 ■ Full support for testing transmission standards of 800G/400G/200G/100G (up to 56GBd, NRZ/PAM4, up to 8 channels) ■ Essential FEC simulation function for burst error analysis ■ High-quality eye pattern of generated signals ■ Easy-to-remove O-SMPM connector for RF interface ■ Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ *For more details, please refer to the PDF document or feel free to contact us.

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  • ビットエラーレートテスター『BA-4000』4.png
  • ビットエラーレートテスター『BA-4000』5.png
  • ビットエラーレートテスター『BA-4000』6.png
  • Tester
  • Error Rate Tester

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Bit Error Rate Tester (BERT) "BA-4000"

Bit Error Rate Tester (BERT) "BA-4000"

High-quality eye pattern of the generated signal! Features an easily detachable O-SMPM connector for RF interface.

The "BA-4000" is a bit error rate tester suitable for testing and evaluating high-speed transmission standards using PAM4 modulation methods such as 800GbE/400GbE, including devices like optical transceivers, OSAs, and FPGAs. In high-speed transmission standards applying PAM4 modulation like 400GbE/800GbE, it is stipulated that FEC (Forward Error Correction) must be used to ensure transmission quality, and evaluations of transmission quality also require assessments that include error correction by FEC. The FEC simulation function of this product provides various analysis capabilities for burst errors. 【Features】 ■ Full support for testing transmission standards of 800G/400G/200G/100G (up to 56GBd, NRZ/PAM4, up to 8 channels) ■ Essential FEC simulation function for burst error analysis ■ High-quality eye patterns of generated signals ■ Easy-to-remove O-SMPM connector for RF interface ■ Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ *For more details, please download the PDF or feel free to contact us.

  • Testing Equipment and Devices
  • Error Rate Tester

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PBT3058 1.6T Bit Error Rate Tester

PBT3058 1.6T Bit Error Rate Tester

From 1.6T optical modules to CPO and SiPh, everything for BERT evaluation in one device.

The Semight PBT3058 is a high-performance bit error rate tester designed for error testing of high-speed serial signals. It is used for physical layer characterization and compliance testing, supporting both PAM4 and NRZ signals. It can handle symbol rates of up to 106.25 GBaud, providing an optimal solution for evaluating next-generation high-speed communication standards.

  • Signal Generator
  • Error Rate Tester

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Signal Quality Analyzer-R "MP1900A"

Signal Quality Analyzer-R "MP1900A"

Total support for physical layer evaluation of high-speed interfaces from the early stages of development!

The Signal Quality Analyzer – R "MP1900A" is a high-performance bit error rate tester with excellent scalability, designed to support physical layer evaluation of high-speed interfaces. This single unit provides total support for evaluations from next-generation Ethernet to bus interfaces from the early stages of development. With the addition of SI PPG, SI ED, and noise generation to its lineup, it strongly supports signal integrity evaluation. Furthermore, the new system view user interface and multi-window functionality have improved operability. 【Features】 ■ Excellent scalability ■ Signal integrity evaluation ■ Link training ■ High-quality waveforms and high sensitivity ■ User-friendly operability *For more details, please download the PDF or feel free to contact us.

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1.6T Bit Error Rate Tester 'B3224'

1.6T Bit Error Rate Tester 'B3224'

Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!

The B3224 is a high-performance Bit Error Rate Tester (BERT) for physical layer characteristic evaluation and consistency testing. With excellent signal quality, a wealth of features, and flexible testing modes (integrated MCB or remote head), it provides powerful performance and flexibility from research and development to manufacturing testing of high-speed serial circuit products. It supports data rates from 24.33 to 120 Gbaud. The test patterns include various PRBS, SSPRQ, JP03A/B, Square Wave, and custom-defined patterns. 【Key Specifications (Partial)】 ■ Output Signal: Differential PAM4/NRZ (AC Coupled) ■ Output Amplitude: 800 mVp-p (Differential) ■ Rise/Fall Time: < 4.5 ps ■ Input Signal: Differential PAM4/NRZ (AC Coupled) ■ Clock Mode: Built-in Clock Recovery *For more details, please download the PDF or feel free to contact us.

  • Tester
  • Error Rate Tester

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